Structure and Composition: X-ray Diffraction, Spectroscopy, Microscopy and EDS
Structure factor, systematic absences and indexing cubic patterns
The structure factor adds the waves scattered by every atom j in the unit cell, at fractional coordinates (uⱼ, vⱼ, wⱼ), with atomic scattering factor fⱼ: F(hkl) = Σ fⱼ exp[2πi(huⱼ + kvⱼ + lwⱼ)]. The intensity is proportional to |F|². If F = 0 the reflection is absent even though Bragg’s law is satisfied, because waves from atoms inside the cell cancel. For a Bravais lattice with one atom type the rules follow from the lattice points alone:
| Lattice | Basis points | F ≠ 0 when | First lines (h²+k²+l²) |
|---|---|---|---|
| SC | (0,0,0) | all hkl | 1, 2, 3, 4, 5, 6, 8 |
| BCC | (0,0,0), (½,½,½) | h + k + l even | 2, 4, 6, 8, 10, 12 |
| FCC | (0,0,0), (½,½,0), (½,0,½), (0,½,½) | h, k, l all odd or all even (unmixed) | 3, 4, 8, 11, 12, 16 |
For BCC, F = f[1 + eiπ(h+k+l)], which is 2f for even h + k + l and 0 for odd. For FCC, F = f[1 + eiπ(h+k) + eiπ(h+l) + eiπ(k+l)], which is 4f for unmixed indices and 0 for mixed ones. The diamond cubic structure (FCC plus a second FCC shifted by ¼,¼,¼) keeps only unmixed hkl and also removes those all-even reflections with h + k + l = 4n ± 2, so its first lines are 3, 8, 11, 16. For a compound such as NaCl (FCC lattice with a two-ion basis), unmixed hkl survive; all-even lines have F = 4(f₁ + f₂) and all-odd lines have F = 4(f₁ − f₂), so odd lines are weak when the two ions scatter almost equally.
Indexing a powder pattern. Convert each peak 2θ to sin²θ, divide all values by the smallest, and compare with the allowed N = h² + k² + l² sequences. SC gives 1:2:3:4:5:6:8; BCC gives 1:2:3:4:5:6:7:8 after dividing the allowed N (2, 4, 6, 8, 10, 12, 14, 16) by 2; FCC gives 3:4:8:11:12, i.e. 1:1.33:2.67:3.67:4. A first ratio of 1.33 means FCC; absence of a 7 (N = 7 cannot be written as a sum of three squares) distinguishes SC from BCC at high angle. Once the lattice is known, a = λ√N/(2 sinθ) from any line.
UV-Vis, IR and Raman spectroscopy
Spectroscopy measures how a material exchanges energy with light. UV-Vis (about 200 to 800 nm) probes electronic transitions: valence to conduction band in semiconductors, d–d and charge-transfer transitions in ions and oxides, π→π* in organics. Infrared absorption (mid-IR 4000 to 400 cm⁻¹, i.e. 2.5 to 25 µm) probes molecular and lattice vibrations. Raman scattering uses a monochromatic (usually visible) laser; a small fraction of the scattered light has lost (Stokes) or gained (anti-Stokes) one vibrational quantum, and the Raman shift (in cm⁻¹, measured from the laser line) equals the vibrational wavenumber.
| Technique | Process | Selection rule | Typical use |
|---|---|---|---|
| UV-Vis | Absorption or reflectance, electronic | Allowed electronic transitions; direct or indirect gap | Band gap, colour, concentration |
| IR | Absorption, vibrational | Dipole moment must change during the vibration | Functional groups, bonds |
| Raman | Inelastic scattering, vibrational | Polarisability must change during the vibration | Phases, defects, carbon forms, strain |
For a molecule with a centre of symmetry the rule of mutual exclusion holds: a vibration that is IR active is Raman inactive and vice versa. In linear CO₂ the symmetric stretch leaves the dipole at zero but changes the polarisability, so it is Raman active only; the asymmetric stretch and the bend change the dipole, so they are IR active only. At room temperature Stokes lines are stronger than anti-Stokes lines because the excited vibrational level is thinly populated (Boltzmann factor). A Raman shift does not depend on the laser wavelength; the absolute scattered wavelength does.
Band-gap measurement from absorption: the Tauc plot
A photon is absorbed across the gap only if hν ≥ E_g, so the absorption coefficient α rises sharply at the absorption edge. A quick estimate is E_g = hc/(e λ_edge); in convenient units E_g (eV) ≈ 1240/λ_edge (nm). For a film, α comes from the measured absorbance A and thickness t as α = 2.303 A/t; for powders, diffuse reflectance R is converted by the Kubelka–Munk function F(R) = (1 − R)²/(2R), which stands in for α.
The Tauc relation is (αhν)1/r = A(hν − E_g), with r = ½ for an allowed direct transition and r = 2 for an allowed indirect transition. Plot (αhν)² against hν for a direct-gap material, or (αhν)1/2 for an indirect one; extend the straight-line part to the hν axis and read E_g at the intercept. Choosing the wrong exponent gives a curved plot and a wrong intercept.
Optical, scanning and transmission electron microscopy
Resolution is the smallest separation at which two points are distinguished. The Abbe limit is d = 0.61 λ/(n sinα) = 0.61 λ/NA, where NA is the numerical aperture of the objective. For visible light (400 to 700 nm) and NA near 1.4 (oil immersion) the limit is about 0.2 µm. Smaller λ and larger NA both help. Depth of field (the range of heights in focus) falls as NA rises, roughly as 1/NA² for an optical microscope, so high-magnification optical images of rough surfaces are in focus only in a thin slice.
Electrons have a de Broglie wavelength λ = h/p. After acceleration through V, eV = p²/2m, so λ = h/√(2m e V), or 1.226/√V nm with V in volts (neglecting relativity). At high voltages the relativistic correction matters: λ = h/√[2meV(1 + eV/2mc²)]. Typical relativistically corrected values are 12.2 pm at 10 kV (12.3 pm without the correction), 3.70 pm at 100 kV and 2.51 pm at 200 kV, about 10⁵ times shorter than visible light. Lens aberrations, not λ, limit electron microscopes, so the NA is kept tiny (semi-angle of order 10⁻² rad), but the resolution still reaches the nanometre or better.
| Feature | Optical | SEM | TEM |
|---|---|---|---|
| Probe | Visible light, 400 to 700 nm | Focused electron beam, about 1 to 30 kV, scanned over the surface | Electron beam, typically 100 to 300 kV, through the sample |
| Signal | Reflected or transmitted light | Secondary electrons (topography), backscattered electrons (atomic-number contrast), X-rays | Transmitted and diffracted electrons: image and diffraction pattern |
| Resolution | About 0.2 µm | Nanometre scale, typically 1 to 10 nm | Sub-nanometre; atomic columns resolved |
| Depth of field | Smallest | Large (narrow beam convergence) | Thin specimen, not a constraint |
| Sample | Polished and etched | Bulk; conducting or coated; vacuum | Electron-transparent thin foil, roughly under 100 nm |
Composition analysis by energy dispersive spectroscopy
When the electron beam of an SEM or TEM ejects an inner-shell electron, an outer electron drops in and the atom emits a characteristic X-ray whose energy equals the difference of the two shell energies. That energy is fixed by the atomic number Z (Moseley: √ν rises linearly with Z), so it names the element; the number of counts at that energy measures how much is there. An energy-dispersive detector (a silicon-based semiconductor detector) records every photon and sorts it by energy, giving the whole spectrum at once with an energy resolution of order 130 eV. Wavelength-dispersive spectrometers (Bragg diffraction from a crystal) resolve far better but scan slowly.
- Qualitative: peaks labelled by element and line (Kα, Kβ, Lα). Overlaps occur when lines lie within the detector resolution, e.g. neighbouring L and K lines of different elements.
- Quantitative: peak intensities are converted to weight or atomic percent with matrix corrections (atomic number, absorption, fluorescence); accuracy is best for flat, polished samples of heavier elements.
- Limits: hydrogen and helium give no characteristic X-rays; the lightest detectable elements (Li to O) are poorly measured because their low-energy photons are absorbed in the sample and detector window; the analysed volume is a micrometre-scale interaction volume in an SEM, so spatial resolution is much worse than the image resolution.
Key takeaways
- Bragg’s law nλ = 2d sinθ with d = a/√(h²+k²+l²) for cubic crystals; the detector angle is 2θ, so halve it before using the law.
- Allowed reflections: SC all; BCC h+k+l even; FCC h, k, l unmixed. Powder sin²θ ratios: BCC 1:2:3:4:5:6:7:8, FCC 3:4:8:11:12:16, diamond 3:8:11:16.
- IR needs a dipole change, Raman a polarisability change; centrosymmetric molecules obey mutual exclusion; Raman shift is independent of the laser wavelength.
- Band gap: E_g (eV) ≈ 1240/λ_edge (nm); Tauc plot (αhν)² for direct and (αhν)1/2 for indirect transitions, intercept on the hν axis.
- Resolution d = 0.61λ/NA; electron λ = 1.226/√V nm (non-relativistic); SEM has the largest depth of field, TEM needs a thin foil and gives sub-nanometre resolution.
- EDS reads characteristic X-ray energies to name elements and counts to quantify them; H and He are invisible and light elements are poorly measured.
Practice questions (17)
Attempt each one before opening the answer. Every explanation names the tempting wrong option as well as the right one, because that is where marks are lost.
In Bragg’s law nλ = 2d sinθ, what does the quantity 2d sinθ physically represent?
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Answer: C — The extra path travelled by the ray reflected from the lower of two adjacent planes
The two rays reflected from adjacent planes of spacing d, with glancing angle θ, differ in path by 2d sinθ. Constructive interference needs this to be a whole number n of wavelengths. The wavelength itself is a property of the radiation, not of this path.Crystal planes in metals are spaced by about 0.1 to 0.3 nm. Why is X-ray radiation, rather than visible light, used to study them by diffraction?
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Answer: A — Its wavelength is of the order of the interplanar spacing, so that λ ≤ 2d can be met
Bragg’s law needs sinθ = nλ/2d ≤ 1, so λ must not exceed 2d. Visible wavelengths (400 to 700 nm) are thousands of times larger than 2d, so no Bragg reflection exists. X-rays of about 0.05 to 0.25 nm satisfy the condition. X-ray penetration into metals is only micrometres to tens of micrometres, X-rays are uncharged, and their photons are far more energetic than visible ones, so the other reasons are false.For a monatomic BCC crystal with one atom per lattice point of the conventional cell, which of the following planes gives no first-order reflection?
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Answer: D — (100)
For BCC the structure factor is f[1 + eiπ(h+k+l)], which vanishes when h + k + l is odd. (100) has sum 1, so F = 0. The planes (110), (200) and (211) have sums 2, 2 and 4 and all reflect, with F = 2f. The (100) reflection of a BCC crystal appears only as the (200) line of the half-spacing planes.A cubic powder pattern has its first four lines at sin²θ = 0.0450, 0.0600, 0.1200 and 0.1650. Which lattice fits?
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Answer: B — Face-centred cubic, since the ratios are 3 : 4 : 8 : 11
Dividing by 0.0150 gives 3, 4, 8 and 11, the allowed N = h² + k² + l² values of FCC: (111), (200), (220), (311). Diamond cubic shares 3, 8, 11 but has no line at 4 (the (200) is extinct) and continues 16. BCC would give 2, 4, 6, 8 and SC 1, 2, 3, 4; neither fits the ratios 1 : 1.33 : 2.67 : 3.67.KCl has the rock-salt structure (an FCC lattice with K⁺ and Cl⁻ in the basis), yet its powder pattern looks like a simple cubic lattice of half the true lattice parameter. What is the reason?
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Answer: A — K⁺ and Cl⁻ are isoelectronic with nearly equal scattering factors, so lines with all-odd indices, whose F is 4(f₁ − f₂), almost vanish
In the rock-salt structure unmixed hkl survive; all-even lines have F = 4(f₁ + f₂) and all-odd lines have F = 4(f₁ − f₂). K⁺ and Cl⁻ each have 18 electrons, so f₁ ≈ f₂ and the all-odd lines are nearly extinct. The surviving all-even lines index as a simple cubic lattice of spacing a/2. The all-even F is a sum, not a difference, so it does not cancel.Which of the following statements about vibrational spectroscopy are correct?
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Answer: A — P: A vibration is IR active only if it changes the molecular dipole moment.; B — Q: A vibration is Raman active only if it changes the molecular polarisability.
P and Q are the two selection rules. The symmetric stretch of CO₂ leaves the dipole at zero throughout, so R is false (it is Raman active). The Raman shift is the energy difference between laser and scattered photon, i.e. the vibrational quantum, and does not depend on the laser, so S is false; only the absolute wavelength of the scattered line moves.A thin film is known to have an allowed direct band gap. Which plot, extrapolated to zero, gives the band gap from its UV-Vis absorption data? (α is the absorption coefficient, hν the photon energy.)
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Answer: C — (αhν)² against hν
The Tauc relation (αhν)1/r = A(hν − E_g) has r = ½ for allowed direct transitions, so (αhν)² is linear in hν above the edge and its intercept on the hν axis is E_g. The exponent ½ in the (αhν)1/2 plot belongs to indirect transitions (r = 2). Plotting α against λ gives only an edge position, not a linear extrapolation.Which statement about the fundamental vibrations of the linear, centrosymmetric CO₂ molecule is correct?
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Answer: B — The symmetric stretch is Raman active and IR inactive; the asymmetric stretch is IR active and Raman inactive
For a molecule with a centre of inversion, vibrations that are symmetric about the centre change polarisability but not dipole (Raman only), and antisymmetric ones change the dipole but not polarisability (IR only): mutual exclusion. Bond lengths do change in the symmetric stretch, but the two induced dipole changes cancel, so the net dipole stays zero.Which of the following statements about microscopes are correct?
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Answer: A — P: At comparable magnification a scanning electron microscope has a much larger depth of field than an optical microscope.; B — Q: A transmission electron microscope needs a specimen that is electron-transparent, typically well under a micrometre thick.
SEM works with a very narrow convergence angle, which gives a large depth of field, so P is true. A TEM beam must pass through the sample, so Q is true. Wavelength is h/√(2meV) and falls as V rises, so R is false. Lens aberrations, not wavelength, limit electron microscope resolution to the nanometre or sub-nanometre range, far above the picometre wavelength, so S is false.For monatomic cubic crystals with one atom per lattice point of the conventional cell, which reflections are allowed?
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Answer: A — P: (200) in BCC; B — Q: (200) in FCC; D — S: (100) in simple cubic
(200) has h + k + l = 2, even, so BCC allows it; its indices (2, 0, 0) are all even, so FCC allows it; simple cubic allows every hkl. (110) has mixed parity (odd, odd, even are not all same), so FCC forbids it; this is why (110) is the strong first line of BCC but absent in FCC.In energy dispersive spectroscopy attached to an electron microscope, which quantity identifies the element present?
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Answer: D — The energy of the emitted characteristic X-ray photons
An inner-shell vacancy filled by an outer electron emits an X-ray photon whose energy is the difference of the shell energies and depends on atomic number, so the photon energy names the element. Diffraction angles give crystal structure, and image brightness reflects topography or mean atomic number, not a specific element.Which of the following elements cannot emit a characteristic X-ray line in an EDS experiment, because after its only electron is ejected no electron remains to fill the vacancy?
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Answer: C — Hydrogen
Hydrogen has a single 1s electron; if the beam removes it, nothing can drop into the vacancy, so no characteristic X-ray is emitted (helium likewise has no outer-shell transition). Carbon, aluminium and copper all have outer electrons that fill K or L vacancies, although carbon’s low-energy line is hard to measure.A cubic crystal has lattice parameter a = 0.405 nm. For X-rays of wavelength λ = 0.154 nm, find the diffraction angle 2θ (in degrees) of the first-order (200) reflection. Give the answer to one decimal place.
Numerical answer — type the value.
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Answer: 44.7
d₂₀₀ = a/√(4) = 0.405/2 = 0.2025 nm. sinθ = λ/2d = 0.154/(2 × 0.2025) = 0.3802, so θ = 22.35° and 2θ = 44.7°. Python check: 2·asin(0.154/0.405) = 44.698°.A powder pattern is known to come from an FCC metal. Its first (lowest-angle) line has sin²θ = 0.0600. Find sin²θ of the fifth line. Give the answer to two decimal places.
Numerical answer — type the value.
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Answer: 0.24
FCC lines have N = 3, 4, 8, 11, 12, … for (111), (200), (220), (311), (222). The fifth line is (222), N = 12. sin²θ ∝ N, so sin²θ = 0.0600 × 12/3 = 0.2400. A tempting error is to use N = 5 (the fifth integer) or to include forbidden mixed indices such as (110).Electrons are accelerated from rest through 10 kV in a scanning electron microscope. Ignoring relativistic effects, find their de Broglie wavelength in picometres. Use h = 6.626 × 10⁻³⁴ J s, m = 9.109 × 10⁻³¹ kg, e = 1.602 × 10⁻¹⁹ C. Give the answer to one decimal place.
Numerical answer — type the value.
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Answer: 12.3
λ = h/√(2meV). 2meV = 2 × 9.109e-31 × 1.602e-19 × 1e4 = 2.9186e-45. Square root = 5.4024e-23. λ = 6.626e-34/5.4024e-23 = 1.2265e-11 m = 12.3 pm. Cross-check: 1.226/√10000 nm = 0.01226 nm.An optical microscope uses light of wavelength 550 nm with an oil-immersion objective of numerical aperture 1.40. Using the Abbe criterion d = 0.61 λ/NA, find the smallest resolvable separation in nanometres. Give the answer as an integer.
Numerical answer — type the value.
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Answer: 240
d = 0.61 × 550/1.40 = 335.5/1.40 = 239.6 nm, which rounds to 240 nm, about 0.24 µm, the usual optical limit. Using the wavelength in metres without converting would only change the unit, not the ratio.The absorption edge of a semiconductor film lies at 400 nm. Estimate its band gap in eV using E = hc/λ with h = 6.626 × 10⁻³⁴ J s, c = 3.00 × 10⁸ m/s and 1 eV = 1.602 × 10⁻¹⁹ J. Give the answer to two decimal places.
Numerical answer — type the value.
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Answer: 3.10
E = (6.626e-34 × 3.00e8)/(400e-9) = 1.9878e-25/4.00e-7 = 4.970e-19 J. Dividing by 1.602e-19 J/eV gives 3.102 eV, so 3.10 eV. Shortcut: 1240/400 = 3.10 eV, consistent.